Getting More Out of Test
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ISSUE HIGHLIGHT:
Guest Editor's Introduction: Getting More Out of Test
by Anne Gattiker,
IBM Austin Research Lab
The 2006 IEEE International Test Conference (ITC) focused on the theme "Getting More Out of Test." This means ensuring product quality and reliability as cost efficiently as possible. In today's market environment, it also means taking test beyond its traditional role of separating good products from bad. The three articles in this special section, all written by well-received ITC 2006 authors, address ways to get more out of test.
The first two articles provide specific examples of techniques for addressing the newly important diagnosis and debugging functions of test. The third article addresses test decision making more generally, and specifically suggests that exploring the psychology that underlies the decisions made by designers, DFT engineers, and test engineers could eventually help to get more out of test. READ IT HERE |
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Dear Samvel Shoukourian,
If you're interested in electronic design automation, test technologies, and the latest in IC design, IEEE Design & Test of Computers belongs on your computer desktop.Ordinarily, we could only offer this magazine at $140, including the cost of IEEE Computer Society membership. Now, thanks to digital edition delivery technologies and our desire to reach a broader audience of computing practitioners with this well-regarded magazine, the IEEE Computer Society, the IEEE Council on Electronic Design Automation, and the Test Technology Council are making subscriptions available for $19.95 -- 87% off our usual price.
Don't miss this limited-time opportunity. Subscribe here.
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September/October Issue Available!
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The September/October issue of IEEE Design & Test introduces some basic design and validation issues of the GALS architecture. The editorial from the guest editors outlines the scope of this special theme. In addition to the special theme, this issue also includes a special section highlighting the International Test Conference (ITC) as well as highlights from the 2007 Design Automation Conference held earlier this year. |
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Sample Article
The Psychology of Electronic Test
by Scott Davidson
Sun Microsystems and Helen Davidson, Davidson Decision Resources
Designers, DFT engineers, and test engineers make many choices as part of their jobs. Although we might think these choices are made purely on the basis of data, in reality they are influenced by psychological factors. This article describes some of these psychological factors and suggests that studying these factors can lead to better decision making.
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 D&T Electronic Edition is a bold new experiment in providing low cost access to high-quality peer-reviewed technical material for the EDA professional. With this launch, D&T joins IEEE Transactions on Computer-Aided Design as a complementary publication targeted at the busy professional. We hope you like the new magazine and join us in the expanding EDA community at CEDA.
-- Al Dunlop, President
IEEE Council on Electronic Design Automation |
 The D&T Electronic Edition joins a growing list of attractive membership benefits for the test technology professionals. As the lead representative of an expanding worldwide test community, TTTC is pleased to actively support and participate in this initiative as this will provide clear benefits for existing and future members of the TTTC.-- Andre Ivanov, Chair
Test Technology Technical Council |
D&T and TTTC have enjoyed a long and close relationship at multiple levels from editors and authors, to special sections, embedded newsletters and electronic broadcasts, to membership and readership of D&T. In a changing publishing environment easy access to publishing and distribution channels enable us to provide erstwhile exclusive benefits to a broader community.The importance of peer reviewed, carefully produced and high-quality technical content is even more acutely felt by the busy professional. We are proud to see D&T take the lead in providing low cost access to such content.-- Yervant Zorian,
Editor-in-Chief Emeritus, IEEE Design & Test
Senior Past Chair, Test Technology Technical Council
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The quick-downloading digital editions are
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The PDF-based and Web browser digital
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IEEE Computer Society
714.821.8380
dprice@computer.org
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